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With the introduction of the MERLIN system, the Carl Zeiss Company proudly launches a new FE-SEM flagship, an instrument dedicated to the high-end analytical FE-SEM market. Based on the new GEMINI II column and the Zeiss Complete Detection System, the MERLIN is the ideal solution for complete analytical characterization, for users who want sample information beyond resolution.
The Scanning Electron Microscope is inherently a 2D visualization tool. Adding the third dimension to information obtained from an SEM is a difficult task, especially when it comes to guaranteeing quantitative measurements. With the new 3 Dimensional Surface Modelling option available for the MERLIN system, Carl Zeiss presents an impressive solution for customers who need quantifiable 3D surface information for a complete analysis of their samples.