Helium Ion Microscope

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News 2011-02-07: R&D contract: Carl Zeiss Receives R&D Contract for Its Gas Field Ion Source (GFIS) Technology 2010-09-20: Nanopatterning with ORION He-Ion Microscope Carl Zeiss Enables Advanced Nano-Fabrication Research Direct Contact for ORION® PLUS For further questions about ORION® PLUS please contact us via: info@nts.zeiss.com Contact Your local contact partner Locations info@nts.zeiss.com Inquiry Form

ORION® PLUS Helium Ion Microscope The helium ion has been called: The Electron of the 21st Century. Explore how the only commercially available sub-nm ion beam has enabled groundbreaking research in both imaging and nanomodi- fication applications: Imaging: - Image charging specimens (including uncoated biological samples) with ease - < 0.35 nm guaranteed resolution - Surface imaging Nanomodification: - Precise Milling and Lithography - Deposition via GIS - 5nm graphene structures and nanopores have been demon- strated to date