Scanning Electron Microscopes
Variable Pressure Solutions
vpse imaging of uncoated paper
VPSE imaging of uncoated paper (7 kV/38 Pa)
vpse imaging of gsr particles
VPSE imaging of GSR particles (10 kV/8 Pa)
The extra dimension of the variable pressure FESEM technology adds an extra dimension with its unique variable pressure (VP) mode for the GEMINI® field emission column which brings many advantages for imaging non conducting specimens without charging artifacts:
  • Superb ultra high resolution in high vacuum mode
  • Ultra high resolution in variable pressure mode (VP) mode - 2.0 nm @ 30 kV
  • Non destructive artefact-free imaging and analysis of samples in their natural state
  • Increase productivity, save costs by eliminating complicated preparation
  • Optimum secondary electron detection in all modes with high efficiency
  • In-lens detector in high vacuum mode and enhanced VPSE detection in VP mode
  • Fully automated vacuum system, with simple click selection of mode and desired pressure
  • Non-charging imaging of insulating samples using analytical conditions - 15 to 30 kV
  • Investigation of moist samples using a cooling stage

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