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| ORION® PLUS - System Features |
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| Imagine seeing things for the very first time |
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 | | See your samples with sub-nanometer resolution in the world's first scanning helium ion microscope. |
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 | | See low-Z materials, like carbon nanotubes, with resolution and surface information unavailable from a typical SEM. |
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 | | See material contrast like you've never seen before. With a higher, more varied secondary electron yield, your images are sharp, clear and bright. |
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 | | See insulating samples where charging effects are minimized by imaging with the unique back-scattered ion mode. |
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For further questions about ORION® PLUS
Please contact us via:
 info-usa@smt.zeiss.com
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