Scanning Electron Microscopes
SUPRA™ FESEM
supra_column The answer to modern nano science challenges is the unique GEMINI® field emission SEM column, a sophisticated solution recognised by microscopists worldwide as the leader. The new SUPRA™ series, based on the 3rd generation GEMINI® column, offers a complete range of ultra high resolution FESEMs models to cover all fields of applications in nano technology, cryo, nano structural materials analysis and semiconductor development and failure analysis.
The key advantages of the GEMINI® FESEM column are superb resolution down to 0.1kV, high efficiency In-lens SE detector, minimal adjustments when changing operating voltage and low magnetic fields at specimen level. The SUPRA's unique variable pressure (VP) capability enables examination of non-conducting specimens without time consuming preparation. The versatile analytical ultra high resolution FESEM concept extends imaging and analytical resolution beyond previously achievable limits.

GEMINI_Teaser_190x102
GEMINI® Technology
Find out more about the unique & innovative electron optical system

Products
SUPRA™ 25
SUPRA™ 40
SUPRA™ 40VP
SUPRA™ 55
SUPRA™ 55VP
SUPRA™ 60
SUPRA™ 60VP
Concept offers
Benefits
SUPRA™ Video Tour

Contact