AURIGA® - CrossBeam® Workstation

The AURIGA® Applications Gallery See the stunning application images of AURIGA® Benefits Learn more about the benefits of AURIGA® Modular Concept Learn more about the modular concept of AURIGA® Technology Learn more about the technology of AURIGA® More Information NanoPatterning Engine GEMINI Technology Current Articles Application Notes Product Information Brochures He-Ion, SEM, FE-SEM, FIB, TEM and NTS Division Literature

News 2009-10-01: Analysis of Shale Rock Carl Zeiss Enables Nanoscale Analysis of Hydrocarbon Deposits in Shale Rock Introduction Video Applications Gallery Applications AURIGA® Brochure Download Download the Brochure of AURIGA®

AURIGA® Information Beyond Resolution Unique Imaging Advanced Analytics Precise Processing Future Assured Does working with your sample cover more than just imaging of the surface? Would you also like to know about the chemical composition or the morphology of your sample? Are you curios about in-depth 3D volume characteristics? Or do you even plan to modify or process your sample? AURIGA® the new CrossBeam® Workstation (FIB-SEM) from Carl Zeiss SMT exactly delivers all this – on a nanoscopic scale. Using the best-in-class FIB column and the proprietary GEMINI e-Beam column from Carl Zeiss, together with a completely new designed vacuum chamber for advanced analytics, AURIGA® assists you in obtaining the maximum information possible out of your sample. Find out more about AURIGA® and its extraordinary capabilities: Benefits