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STEM image of olymer to illustrate the rosolving power of the STEM unit
 enlarged version | | The STEM unit, especially developed for the SUPRA™ series consists of an electron detector underneath a thin specimen with a set of shutters to select either dark field or bright field imaging and to optimize the STEM image quality. The images obtained with the SUPRA™ STEM unit are similar to images obtained by a TEM with a scanning attachment.
The SUPRA™ STEM unit unique features are:
- Improved resolution by reducing the excited volume and compared with TEM imaging no chromatic aberration introduced by the projection lens system
- Contrast enhancement due to increased working cross sections for lower accelerating voltage
- Unique contrast tuning for low contrast specimens
- Small excited volume in thin sections results in dramatic improvement of resolution for EDS analysis, enabling nano-particle analysis
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