KV_ParticleAnalysis Particle Analysis
SmartPITM
Smart Particle Investigator (SmartPITM) is a powerful particle analysis package for use with all conventional and field emission Scanning Electron Microscopes (SEM) from Carl Zeiss. It enables the automatic detection, investigation and characterisation of particles of interest.

SmartPI_image
X-ray analysis and chemical classification of filtered particles from manufacturing cleanliness monitoring in the automotive industry.

SmartPITM incorporates all aspects of the SEM control, image processing and Energy Dispersive Spectroscopy (EDS) analysis for particle detection and characterisation within a single application. SmartPITMautomates repetitive sample analysis to provide non-subjective results with minimal user involvement and enables continuous unattended operation of the instrument.

Advantages of SmartPITM
  • Ease of Use
  • Auto-calibration and Self-diagnostic Procedures
  • Morphological & Chemical Classification
  • Border Particle Stitching
  • Advanced Stop Criteria
  • SmartPITM Reporter
  • SmartPITM Explorer
...for more information please download the Smart PI™ flyer
More Information
Teaser_SmartPI_Brochure
Download the SmartPI™ flyer