Product Information

Product Information SEM (EVO®) EVO® Crossed Polarised Light Accessory for SEM EVO® Cathodoluminescence Detector EVO® Stubscope EVO® MA and LS Fisheye OptiBeam® mode EVO® MA and LS VPSE G3 Detector EVO® MA and LS Coolstage EVO® MA and LS STEM Detection System EVO® MA and LS Backscattered Detector EVO® – Five Segment ZEISS Backscattered Detector EVO® MA/LS series and ΣIGMATM – Chamberscope and Downscopes FE-SEM (GEMINI® Technology) 3DSM - 3D Surface Modelling In-situ Sample Cleaning ΣIGMATM Cathodoluminescence Detector Cathodoluminescence Detector for FE-SEM Optiprobe – Continous adjustable probe current up to 100 nA GEMINI® HC/DoF Module GEMINI® Multi-Mode STEM Detection System High Efficiency In-lens Detector for the GEMINI® column Detection Principles based on GEMINI® Technology Optimised EBSD Analysis with the SUPRA™ FESEM FIB-SEM (Cross Beam® Workstations) Annular Milling FeatureMill Functionality for Atom Probe Tip Preparation Knights CAMELOT CAD navigation software for Carl Zeiss CrossBeam® series integration TEM Lift-out Tools for FIB prepared Lamellas SEM Accessories SmartBrowse ATLASTM - Large Area Imaging for Unrivaled Productivity SmartSEM®: Image Navigation ORION® PLUS /HIM Helium-Ion Microscope Beam Induced Chemistry in the ORION® PLUS Particle Elemental Identification in the ORION PLUS Spectra Ultra-High Resolution Imaging in ORION PLUS

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