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| Updates for EVOŽ |
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Several updates have been released for the EVOŽ SEM. These updates comprise a new backscatter electron detector (BSD) with enhanced low keV sensitivity, a probe current monitor for x-ray microanalysis and a new BeamSleeveŽ design.
| New low kV Sensitve Backscatter Electron Detector (BSD) | | New 1mm BGPL BeamSleeveŽ |
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| Probe Current Monitor for X-ray Microanalysis and Lithography Applications | | |
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SEM Microscopes
EVOŽ Products |