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| Innovative Electron Optical System |
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Already in 1994 Carl Zeiss presented a break-through technology for scanning electron microscops: the GEMINI® e-Beam column. Due to its unique design, GEMINI® offers still unrivaled imaging possibilities. With the emergence of FIB/SEM workstations a further unique feature of GEMINI® became evident: the capability of simultaneous milling and imaging. Find out more about the groundbreaking GEMINI® e-Beam column design.
| GEMINI® Beam Booster | | Objective Lens |
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The innovative GEMINI® column concept provides superior beam brightness with ultra high resolution over the complete voltage range together with high probe currents for analytical applications. |
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The unique GEMINI® lens design has many advantages over classical lens designs. |
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| SE Signal Detection | | |
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The GEMINI® objective lens concept allows optimum detection of all signals generated at the specimen. |
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SEM Microscopes
CrossBeam® Workstations (FIB-SEM) |