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| Versatile High Performance VP SEM |
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The unique variable pressure capabilities add an extra dimension to this extraordinary versatile nanotool. It enables ultra high resolution imaging and analysis of non conducting specimens without time consuming preparation. The true workhorse in the SUPRA™ family is well suited for failure analysis, life sciences, nanotech and analytical applications. The combination of the large analytical chamber, the new GEMINI® column and the robust VP technology delivers true performance for a wide range of applications.
Key Features:
- Superb resolution and image quality at low operating voltages
- Wide operating voltage range with minimal adjustments required
- Short working distance of 8.5 mm for simultaneous high resolution imaging and X-ray analysis
- High probe current (up to 20 nA) and high stability better than 0.2 %/h for analytical applications
- High efficiency In-lens detector for clear topographic imaging in high vacuum mode
- Enhanced VPSE detector in VP mode
- Easy operation through Windows® based SmartSEM™ control software
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Contact
 Carl Zeiss NTS GmbH, Oberkochen
Phone: +49 7364 20 4488
Fax: +49 7364 20 4343
 Inquiry
 info-nts@smt.zeiss.com
 www.smt.zeiss.com/nts |