| | The NEON® 40 platform with its 6-axis super eucentric stage designed for small to medium sized samples provides standard chamber and in-lens secondary electron detectors for general purpose analytical work.
The ultra high resolution GEMINI® field emission platform be upgraded with the sophisticated Canion FIB the NEON® 40 CrossBeam® for providing the perfect solution for three dimensional analysis with no compromises on SEM imaging capabilities. The unique live SEM imaging capability of the instrument during FIB operation mode gives full control when analysing critical samples. The superior super eucentric stage with the clear SmartSEM™ integral Windows® control system makes the NEON® 40 CrossBeam® the ultimate research tool. A wealth of further upgrades and instrument options like the multi-channel gas injection system, mass spectrometer, dedicated airlocks, EBSP, EDS, WDS and additional analytical detectors assures that the NEON® 40 can be configured for demanding applications.
Key Features
- Ultra high resolution FESEM with unique GEMINI® column
- High performance CANION FIB column as upgrade
- Multi-channel gas injection system for material deposition and enhanced or selective etching as upgrade
- CrossBeam® operation: high resolution live imaging during milling and polishing
- Endpoint detection for automated milling
- Automated TEM preparation software package
- Super eucentric, fully motorised stage
- Highly reliable pumping system, compatible with the toughest conditions
- Image archiving, networking and hardcopy solutions from the integral Windows® operating system
 Essential Specification - NEON® Series
Contact
 Carl Zeiss NTS GmbH, Oberkochen
Phone: +49 7364 20 4488
Fax: +49 7364 20 4343
 Inquiry
 info-nts@smt.zeiss.com
 http://www.smt.zeiss.com/nts |