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- Specimens
- High-contrast imaging of unstained, thin specimens
- New specimen information through structure and element sensitive contrast
- Maximum resolution, optimum depth of focus and individual contrast balance in the imaging of thick specimens
- Minimum preparation work required
- Conventional operation, no additional alignment required
- Element imaging and comprehensive element analysis with utmost detection sensitivity and maximum local resolution
- Superb performance in imaging and analysis
- No performance deterioration when using attachments, due to integral instrument concept
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