Essential Specification
XVision 300
SEMFIB
Resolution3 nm @ 5 kV4 nm @ 30 kV
Probe Current4 pA - 20 nA0.15 pA - 45 nA
Acceleration Voltage1 kV - 30 kV1 kV - 30 kV
Ion Source
Electron Source
Ga liquid metal ion source
Thermal field emission type
Observation Field0.5 x 0.5 um to 2 mm Ø
Operating Pressure
High vacuum main chamger:8x10-5 Pa or lower
Ion source chamber:1x10-5 Pa or lower
Electron source chamber:1x10-6 Pa or lower
Specimen Chamber
Integrated ports for: FIB, Detector (SED, EDS), SEM, Light, Gas Injector, CCD Camera, Ar Ion Optics
Specimen Stage5-axes fully eucentric, all motorised
X = 327mm
Y = 327mm
T = -5 - 60°
R = 360° continuous
Image Display19" TFT monitor (2 sets)
image displayed at 1280 x1024pixel
Image Memory MediumCD-R/RW
System ControlWindows®XP based SIINT user software operated by mouse and keyboard