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| NVision 40 Argon Ion Beam Option |
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| NVision 40 Argon Ion Beam Option |
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| | The unique supreme milling capability of the NVision40 CrossBeam® Workstation provides the solution to ultra high quality transmission electron microscopy sample preparation.
Rapidly prepare site specific TEM samples under high resolution live imaging control based on the advanced zeta focused ion beam column and unique GEMINI® FESEM technology. For highest demands in ultra high resolution TEM results simply add a final polishing step using the low energy Argon ion beam option.
Leverage on the power of speed and precision uniquely combined in a single instrument.
- Ultra high resolution FESEM imaging based on the unique GEMINI® column concept
- Rapid milling with best-in-class zeta focused ion beam column
- Compositional information with the ultra high efficiency EsB detector
- Ultra high quality sample preparation with the optimised low energy Argon ion plasma gun
- High resolution live imaging control during FIB and Argon ion beam operation
- Ease-of use by a common beam coincident point
- Advanced deposition and etching employing the single nozzle multi channel gas injection system
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Essential Specification
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