Electron Microscopes
Features of EFTEM
In-column OMEGA-Filter
  • All conventional electron optical properties are retained due to the patented spectrometer con-figuration
  • Symmetrical spectrometer design ensures automatic compensation of image aberrations, e.g. distortion in the achromatic image plane
  • Optimum adaptation of achromatic field size and spectrum detail to detector size and user requirement due to a variable, second projector system

State-of-the-art vacuum technology
  • Optimum specimen protection against hydrocarbon contamination
  • Instant readiness for operation, fast specimen exchange times
  • Minimum maintenance required
  • Digital electronics and WinTEM user interface
  • New digital electronics with sub-ppm stability
  • Very high reproducibility and speed when executing repeat functions
  • High integration of electronics on only a few boards
  • Minimum alignment effort due to extra high stability
  • and the storage of user data

Computer-controlled Goniometer
  • High-precision specimen positioning in 4- or 5-axes
  • Automatic return of stored specimen positions
  • Up to 70° α-tilt possible in high-tilt (HT) pole piece geometry