KV_EVO_192x60 Updates for EVOŽ
New low kV Sensitve Backscatter Electron Detector (BSD)
EVO Update
15 kV
EVO Update
3 kV
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  • The introduction of the five segment Si diode based BSD (5S BSD) brought additional sensitivity and shadow mode imaging to the EVOŽ series of microscopes.
  • Recent further design changes have maximized sensitivity for low keV electrons for this 5S BSD package.
  • Lifescience:
    Greatly improved imaging of light, carbon rich life science specimen is made a reality.
  • Materials:
    Surface layers and surface structures become visible by using lower beam energies. The example images of an aluminium fracture surface show the difference in information content arising from changing from 15 keV to 3 keV. At 3 keV, and for aluminium, the interaction volume is sufficiently shallow that the contrast emphasises the important surface features. At 15 keV the interaction volume is so large that the surface information is not visible.
  • The performance at higher keV needed for x-ray microanalysis remains maximised.
Product Information 5S BSD
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Product Information 5S BSD