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| Material Analysis Applications |
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One of the challenges for material scientists is to see the difference between materials or to see crystal structures. The ORION® PLUS helium ion microscope has material contrast mechanisms that are quite different from an SEM to make it easier to distinguish one material from another.
In an SEM, there is often very little difference in secondary electron yield between various materials. In the ORION® PLUS helium microscope the differences in secondary electron yield can be quite large. This translates directly into contrast, making it easier to distinguish materials.
Another technique that offers direct material information is to collect backscattered helium ions in much the same way as Rutherford Backscattered Spectroscopy. These backscattered helium ions can be analyzed to provide direct material characterization. It is like RBS, but with extremely good spatial resolution. | |
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