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Unique Imaging
- Imaging of non-conductive specimens using all standard detectors with local charge compensation
- Simultaneous detection of topographical and compositional information with a unique detector scheme including EsB-technology
- Investigation of magnetic samples with GEMINI® objective lens design
Advanced Analytics
- Analysis of non-conducting materials with local charge compensation
- Multi-purpose chamber with 15 accessory ports
- Optimum chamber geometry for the simultaneous integration of EDS, EBSD, STEM, WDS, SIMS etc.
Precise Processing
- Innovative FIB technology with best-in-class resolution (< 2.5 nm)
- High resolution live FE-SEM monitoring of the entire preparation process
- Advanced gas processing technology for ion and e-beam assisted etching and deposition
Future Assured
- Expandable platform concept based on GEMINI® FE-SEM technology
- Modular building blocks for value-adding functionality
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