Electron Microscopes
Key Features
High resolution, enhanced contrast, multi-mode imaging capabilities
Class leading X-ray analysis capabilities
XVP® mode with air or water up to 750 Pa
Enhanced VPSE detector for SE imaging in XVP® mode
Upgrade path from HV via XVP® to EP (for EVO® 50 and EVO® 60)
Intuitive operation with Windows® based
SmartSEM™ with multi-lingual task orientated GUI

Seamless integrated hardpanel for direct function access
ICE - Integrated Computer Environment