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| Inauguration of TEM CRISP at caesar, Bonn |
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Together with the researchers of the Bonn foundation caesar Carl Zeiss SMT, Nano Technology Systems Division, installed there a globally unique TEM (Transmission Electron Microscope). The CRISP system (for Corrected Illumination Scanning TEM Probe) enables previously unequalled views possible of the internal characteristics of materials. This is possible through its singular combination of various electron-optical components and subsystems.
The inauguration was celebrated successfully, June 14, 2007 at Forschungszentrum caesar, Bonn.
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| Invitation TEM CRISP Inauguration |
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Dr. Markus Dilger, earlier Managing Director of the Nano Technology Systems Division at Carl Zeiss SMT and Dr. Hartwig Bechte, Commercial Administrator at the caesar Institute celebrating the officially TEM CRISP inauguration at caesar, Bonn.
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| Dr. Markus Dilger, earlier Managing Director of the Nano Technology Systems Division at Carl Zeiss SMT (left), and Dr. Hartwig Bechte (right), Commercial Administrator at the caesar Institute |
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CRISP System
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