Helium-Ion Microscope

He-Ion Microscope ORION® PLUS Concept System Features Technology Solutions Image Gallery ORION® PLUS - World Record Resolution changes microscopy paradigm More Information ORION® - Press Releases Latest News about the He-Ion Microscope ORION® PLUS Brochure available Brain Mapping Direct Contact for ORION® PLUS For further questions about ORION® PLUS please contact us via: info-usa@smt.zeiss.com Contact Locations info-nts@smt.zeiss.com Inquiry Form

News July 2009 Unique Spectra detector is like 'playing billiards with atoms' Univ of Southampton Full article... June 2009 Helium Ions Etch Graphene Devices Read more... May 2009 EIPBN Award for ORION® March 2009 New “Spectra” detector New “Spectra” detector for materials characterization at the nanometer scale December 2008 ORION® PLUS - World Record Resolution changes microscopy paradigm October 2008 Prestigious R&D Award 100 for Revolutionary Helium Ion Microscope ORION®

ORION® PLUS World Record Resolution changes microscopy paradigm The world of microscopy just changed. The Carl Zeiss SMT ORION® PLUS Helium-ion-microscope just broke the world record for resolution. The ORION® PLUS microscope now delivers TEM-like resolution, on bulk samples, with SEM-like ease-of-use. This breakthrough in resolution truly puts the ORION® PLUS in a class of its own, providing an opportunity to see things you’ve never before seen. These additional features of the ORION® PLUS add to its unequalled value as an imaging and analysis tool: • Unique Ion Contrasts that yield information about materials not otherwise available; • Incredible Surface Detail with contrast from only the top few atomic layers; • High Energy Beam that is gentle on samples; and • Charge Neutralization that allows imaging insulators at high magnification. See for yourself. Contact us for a demo of the ORION® PLUS.