Electron Microscopes
SUPRA™ 55VP


complete picture
Versatile High Performance VP SEM
Combining several instruments in one, the SUPRA™ 55VP with the improved GEMINI® column is a true nanoscience FESEM. It provides ultra high resolution imaging over the complete voltage range with the ability to handle large awkwardly shaped specimens. It is also a fully analytical FESEM with up to 20nA probe current available and comprises variable pressure technology for examining non-conducting specimens without prior time consuming preparation.

Key Features
  • Ultra high resolution at low kV: 1.7nm @ 1.0kV, 4 nm @ 0.1kV
  • High efficiency In-lens detector for clear topographic imaging in high vacuum mode
  • Enhanced VPSE detector for VP mode: 2nm @ 30kV
  • Ultra stable high current mode X-ray analysis and EBSD applications; better than 0.2%/h
  • Large 5-axes motorised eucentric stage
  • Fully automated vacuum system with straight forward point and click selection of vacuum pressure
  • Easy operation through Windows® based SmartSEM™ control software

Essential Specification


Contact
Carl Zeiss NTS GmbH, Oberkochen
Phone: +49 7364 20 4488
Fax: +49 7364 20 4343
Inquiry
info-nts@smt.zeiss.com
http://www.smt.zeiss.com/nts