To overview |
|
| | |||
| New Class |
| ΣIGMA from Carl Zeiss: Affordable analysis | Downloads and Links | ||
| New class of SEM centered on unique GEMINI technology | RTF Documents
english (37 KB)Further Information 
Carl Zeiss SMT AG
The SMT Story | ||
| ALBUQUERQUE/New Mexico/USA , 04.08.2008. At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: ΣIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed. The ΣIGMA, featuring the unique and proven GEMINI® technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS). The ΣIGMA can handle specimens of up to 250 mm diameter and 145 mm tall. Furthermore, the coplanar chamber design provides the ideal geometry for simultaneous EDS and electron backscattered diffraction (EBSD). GEMINI® as the market leading Field Emission design, offers unrivalled ease of use, superb low voltage imaging and ultra stable probe currents for analytical applications.  New class of SEM centered on unique GEMINI technology: ΣIGMA. Markus Wiederspahn Public Relations Carl Zeiss SMT AG Phone: +49 7364 20-2194 Fax: +49 7364 20-9206 E-Mail: wiederspahn@smt.zeiss.com Number: 0141-2008-ENG SE Number of Words: 198 Number of Signs: 1534 |
|