26.08.2010
Correlative Microscopy: Carl Zeiss Introduces Correlative Light and Electron Microscopy Solution for Life Sciences
12.08.2010
First PROVE™ System Shipped: Carl Zeiss Shipped First 32 nm Photomask Registration and Overlay Metrology System PROVE™ to NuFlare Technology
02.08.2010
GIS System for ORION® Plus: Exciting Nanofabrication Capabilities Are Now Available on Carl Zeiss Helium Ion Microscope
02.08.2010
New VP Sales: James (Jim) Pouquette joins Carl Zeiss
29.07.2010
PROVE™ achieves Milestone: SEMATECH and Carl Zeiss Demonstrate Mask Pattern Alignment and Registration to Enable Double Patterning Lithography
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