Product overview

EVO SEMs with XVP and EP mode for imaging of non-conducting and wet specimens SUPRA fieldemission SEM for cryo applications and superb low voltage imaging ULTRA fieldemission SEM with dual In-column detector for nano-particle imaging LIBRA® EFTEM range for high quality imaging and analysis New Electron Microscope Groundbreaking Development Project for Biotechnologies Current Events and Trade Shows Technology Portfolio broadened Carl Zeiss SMT acquires ALIS Corporation Global strategic alliance Carl Zeiss NTS and SII Nanotechnology broaden cooperation Going strong and fast at forty Carl Zeiss SMTcelebrates 40 years of SEM News from CrossBeam® First CrossBeam® EsB system with dual in-column detection capability Carl Zeiss NTS GmbH Systems provider in Nanotechnology

The Carl Zeiss SMT range of scanning electron microscopes (SEM), field emission scanning electron microscopes (FE-SEM), and energy filtering transmission electron microscopes (TEM) offer unique capabilities for biological, pharmaceutical and diagnostic applications. The scanning electron microscopes with the ability for higher pressures in the specimen chamber allow imaging of delicate and/or hydrated specimens without intrusive preparation.